翻訳と辞書 Words near each other ・ Semicircular potential well ・ Semiclassical ・ Semiclassical gravity ・ Semiclassical physics ・ Semiclivina ・ Semicollared flycatcher ・ Semicollared hawk ・ Semicollared puffbird ・ Semicolon ・ Semicomma ・ Semicomputable function ・ Semiconductor ・ Semiconductor (artists) ・ Semiconductor (disambiguation) ・ Semiconductor Bloch equations ・ Semiconductor characterization techniques ・ Semiconductor Chip Protection Act of 1984 ・ Semiconductor consolidation ・ Semiconductor curve tracer ・ Semiconductor detector ・ Semiconductor device ・ Semiconductor device fabrication ・ Semiconductor device modeling ・ Semiconductor Equipment and Materials International ・ Semiconductor equipment sales leaders by year ・ Semiconductor fabrication plant ・ Semiconductor fault diagnostics ・ Semiconductor industry ・ Semiconductor Industry Association ・ Semiconductor intellectual property Dictionary Lists mini英和辞書 mini和英辞書 Webster 1913 Latin-English FOLDOC Wikipedia English ウィキペディア

翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク Semiconductor characterization techniques ： ウィキペディア英語版 Semiconductor characterization techniques The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization == Electrical Characterization Techniques == Electrical Characterization can be used to determine resistivity, carrier concentration, mobility, contact resistance, barrier height, depletion width, oxide charge, interface states, carrier lifetimes, and deep level impurities. Two-Point Probe, Four-Point Probe, Differential Hall Effect, Capacitance-Voltage Profiling, DLTS, Electron beam-induced current, and DLCP. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Semiconductor characterization techniques」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.